<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Ureña, J.</style></author><author><style face="normal" font="default" size="100%">Vrkonyi-Kczy, Annamria R.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Special Section on the 2007 IEEE International Symposium on Intelligent Signal Processing</style></title><secondary-title><style face="normal" font="default" size="100%">IEEE Transactions on Instrumentation and Measurement</style></secondary-title><short-title><style face="normal" font="default" size="100%">IEEE Trans. Instrum. Meas.</style></short-title></titles><dates><year><style  face="normal" font="default" size="100%">2009</style></year><pub-dates><date><style  face="normal" font="default" size="100%">08/2009</style></date></pub-dates></dates><volume><style face="normal" font="default" size="100%">58</style></volume><pages><style face="normal" font="default" size="100%">2375 - 2376</style></pages><language><style face="normal" font="default" size="100%">English</style></language><abstract><style face="normal" font="default" size="100%">This paper is the Special Section of the IEEE Transactions on Instrumentation and Measurement (TIM) on the 2007 IEEE International Symposium on Intelligent Signal Processing (WISP'2007), which is the fifth symposium on this matter organized by the IEEE Instrumentation and Measurement Society. It was held in Alcala de Henares, Madrid, Spain, on October 3-5, 2007, with the main aim of highlighting how the use of intelligent signal processing contributes toward the solution of current challenges for system measurements in a diversity of fields of application and promotes emerging technologies.</style></abstract><issue><style face="normal" font="default" size="100%">8</style></issue></record></records></xml>